Abstract und Zusammenfassung zu
"Developement of Control for a High Temperature DC Measurement Setup and Optimization of the Setup"
(Entwicklung einer Steuerung für einen Hochtemperatur DC- Messplatz und Optimierung des Messplatzes)

Vorlesung


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Zusammenfassung

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Abstract

"Semiconductor material and component characterization is an essential part of the research and development process. An elegant method to study the characteristics of the elements and/or individual process steps is the investigation of the temperature-dependent characteristics. The aim of this master thesis is to build a high temperature measurement setup which is capable of reaching and maintaining a maximum temperature value of 500 °C and optimize the measurement setup. Software for the temperature control process has been developed in multitasking architecture, providing a convenient environment to work."

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